发明名称 Method for manufacturing semiconductor device
摘要 In the method for removing etching residue adhered on a semiconductor substrate using a stripping liquid containing fluorine, the stripping liquid on the semiconductor substrate can be flung away by rotating the semiconductor substrate after the residue removing treatment. Thereby, the etching of the interlayer insulating film caused between the residue removing treatment and washing with water can be minimized.
申请公布号 US2003119331(A1) 申请公布日期 2003.06.26
申请号 US20020151161 申请日期 2002.05.21
申请人 MURANAKA SEIJI 发明人 MURANAKA SEIJI
分类号 H01L21/28;H01L21/304;H01L21/306;H01L21/311;H01L21/768;(IPC1-7):H01L21/302;H01L21/461 主分类号 H01L21/28
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