| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a verify-method of a semiconductor integrated circuit device in which sufficient evaluation of reliability of a non-destruction fuse module after assembling can be performed. <P>SOLUTION: This device is provided with a first transistor Mep0 having a floating gate Fg0 and to which data is written, a second transistor Mer0 having a floating gate Fg0 connected jointly with the floating gate and reading out the data written in the Mep0, and a control gate section 243 coupled to the floating gate and controlling read-out operation of the Mer0. This method is provided with a step by which the first data outputted through the Mer0 when a first potential (normal power source voltage) is applied to the control gate section is compared with the second data outputted through the Mer0 when a second potential (normal power source boosting voltage) is applied to the control gate section, and a step by which verifying of the data is performed based on the compared result, and the first potential is different from the second potential. <P>COPYRIGHT: (C)2003,JPO |
