摘要 |
PROBLEM TO BE SOLVED: To provide a method for manufacturing a silicon nitride film, a silicon oxynitride film, or a silicon oxide film, of little hydrogen and carbon content, without generating ammonium chloride, even at a low temperature by a CVD method. SOLUTION: This manufacturing method is characterized by using at least one compound selected from the group consisting of tetrakis(hydrocarbylamino) silane indicated by the formula: Si(NHR<SB>i</SB>)<SB>4</SB>and tris(hydrocarbylamino)silane indicated in the formula: SiH(NHR<SB>i</SB>)<SB>3</SB>, (wherein each R<SB>i</SB>is a 1-4C hydrocarbon group) for a precursor of the silicon nitride film, the silicon oxynitride film, or the silicon oxide film. COPYRIGHT: (C)2003,JPO
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