发明名称 PHOTORESIST ADDITIVE FOR IMPROVING PATTERN DEGRADATION AND PHOTORESIST COMPOSITION CONTAINING THE ADDITIVE
摘要 PURPOSE: A photoresist composition, a method for forming photoresist pattern and a semiconductor device prepared by the method are provided, to improve the degradation of pattern by lowering the surface tension of photoresist itself and increasing the adhesive strength between photoresist pattern and an etched layer. CONSTITUTION: The photoresist composition comprises a base resin; a photoacid generator; an organic solvent; and 0.01-0.2 wt% of at least one salt compound selected from the group consisting of thiazolium salts, indolium salts and pyrylium salts as an additive. Preferably the base resin a chemical amplification photoresist polymer and has a repeating unit represented by the formula 2, wherein R1 is an acid-liable protecting group; R2 is a hydroxyalkyl group of C1-C10; the ratio of a : b : c : d is 0-50 : 20-50 : 1-30 : 0-45 by mol; and n is 1 or 2.
申请公布号 KR20030045471(A) 申请公布日期 2003.06.11
申请号 KR20010076195 申请日期 2001.12.04
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG, JAE CHANG;LEE, GEUN SU;SHIN, GI SU
分类号 G03F7/004 主分类号 G03F7/004
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