发明名称 CERAMIC SUBSTRATE FOR SEMICONDUCTOR MANUFACTURING AND INSPECTION UNIT
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a ceramic substrate enhanced in elevating temperature characteristics and adsorption capability, and enhanced in connection reliability between electric conductors embedded in the substrate and external terminals. <P>SOLUTION: The ceramic substrate for semiconductor manufacturing and inspection unit, where the electric conductors are embedded inside an insulative ceramic substrate, bag holes are provided from a substrate surface toward the embedded electric conductors, and the external terminals are attached via the bag holes, an electric conductive layer is provided at least on a part of the inner walls of the bag holes, and the electric conductors and the external terminals are electrically connected via the part of the conductive layer. <P>COPYRIGHT: (C)2003,JPO</p>
申请公布号 JP2003163146(A) 申请公布日期 2003.06.06
申请号 JP20020205644 申请日期 2002.07.15
申请人 IBIDEN CO LTD 发明人 ITO YASUTAKA;FURUKAWA MASAKAZU;HIRAMATSU YASUJI
分类号 H05B3/20;H01L21/02;H01L21/68;H01L21/683;H05B3/02;H05B3/74;(IPC1-7):H01L21/02 主分类号 H05B3/20
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