发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which is surely obtained through a certain method that is different from a conventional one to realize the gradient composition of a metal silicate for improving its interface with silicon in interface characteristics and its manufacturing method. SOLUTION: A semiconductor device is equipped with a silicon-containing semiconductor layer (10); an insulating layer (20) which is formed thereon and contains silicon (Si), oxygen (O), nitrogen (N), and metal element, and a conductive layer (30) formed thereon. The insulating layer (20) has a distribution of metal concentration in which metal concentration becomes lower at points closer to the semiconductor layer and higher at points closer to the conductive layer and a distribution of nitrogen concentration in which nitrogen concentration becomes higher at points closer to the semiconductor layer and lower at points closer to the conductive layer.
申请公布号 JP2003158262(A) 申请公布日期 2003.05.30
申请号 JP20010358063 申请日期 2001.11.22
申请人 TOSHIBA CORP 发明人 KOYAMA MASATO;NISHIYAMA AKIRA;KANEKO AKIO
分类号 H01L21/8247;H01L27/115;H01L29/78;H01L29/788;H01L29/792;(IPC1-7):H01L29/78;H01L21/824 主分类号 H01L21/8247
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