发明名称 |
Production of a semiconductor element comprises forming a light doped amorphous silicon layer on a substrate, thermally treating the silicon layer to form a polysilicon layer, forming a conducting layer, and implanting impurity ions |
摘要 |
Production of a semiconductor element comprises forming a light doped amorphous silicon layer on a substrate; thermally treating the silicon layer to form a polysilicon layer; forming a conducting layer on the polysilicon layer; and implanting impurity ions of first conductivity in the polysilicon layer to form a first conducting region and implanting impurity ions of second conductivity in the polysilicon layer to form a second conducting region. Preferred Features: The impurity ions of first conductivity are arsenic ions and phosphorus ions. The doped silicon layer is produced by lightly doping with impurity ions of first conductivity having a first concentration. The conducting regions are made from tungsten silicide, titanium silicide, molybdenum silicide, tantalum silicide or cobalt silicide.
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申请公布号 |
DE10156489(A1) |
申请公布日期 |
2003.05.28 |
申请号 |
DE20011056489 |
申请日期 |
2001.11.16 |
申请人 |
PROMOS TECHNOLOGIES, INC. |
发明人 |
HSU, CHIA-HU;CHENG, CHIN-CHENG |
分类号 |
H01L21/265;H01L21/28;H01L21/324;H01L21/8238;H01L21/8242;(IPC1-7):H01L21/823;H01L21/336;H01L21/824 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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