发明名称 Production of a semiconductor element comprises forming a light doped amorphous silicon layer on a substrate, thermally treating the silicon layer to form a polysilicon layer, forming a conducting layer, and implanting impurity ions
摘要 Production of a semiconductor element comprises forming a light doped amorphous silicon layer on a substrate; thermally treating the silicon layer to form a polysilicon layer; forming a conducting layer on the polysilicon layer; and implanting impurity ions of first conductivity in the polysilicon layer to form a first conducting region and implanting impurity ions of second conductivity in the polysilicon layer to form a second conducting region. Preferred Features: The impurity ions of first conductivity are arsenic ions and phosphorus ions. The doped silicon layer is produced by lightly doping with impurity ions of first conductivity having a first concentration. The conducting regions are made from tungsten silicide, titanium silicide, molybdenum silicide, tantalum silicide or cobalt silicide.
申请公布号 DE10156489(A1) 申请公布日期 2003.05.28
申请号 DE20011056489 申请日期 2001.11.16
申请人 PROMOS TECHNOLOGIES, INC. 发明人 HSU, CHIA-HU;CHENG, CHIN-CHENG
分类号 H01L21/265;H01L21/28;H01L21/324;H01L21/8238;H01L21/8242;(IPC1-7):H01L21/823;H01L21/336;H01L21/824 主分类号 H01L21/265
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