Electronic test system and method

摘要

An electronic test system (100) having an object oriented hierarchical structure (405) including classes that allow a test developer or a test user to design a desired electronic test system. The class relationships define the function of the electronic test system. Classes include a procedure class (504), a test class (508), a measurement class (512), a datapoint class (516), a parameter class (524), a DUT class (538), a test system class (542), a specification class (528), a run procedure class (534), a result class (530), a plug-in class (412), an exec class (402), as well as other classes. These classes are implemented in the hierarchical structure (405) in which a datapoint is a subset of a measurement, a measurement is a configuration for a test, a test is a group of measurements that share the same test algorithm, and a procedure is an ordered list of tests to be run, and includes a list of measurements and datapoints. <IMAGE>