| 摘要 |
PROBLEM TO BE SOLVED: To realize an IC tester and a DUT card that can test an image activating driver with a test time suppressed without various kinds of limitations. SOLUTION: The IC tester testing the image activating driver having a plurality of output pins is improved. A device is provided with a test head that transmits and receives a signal and tests, a performance board electrically connected to this test head to transmit and receive the signal with the test head, and the DUT card connected to this performance board by switching the output pin of the image activating driver.
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