发明名称 Bit-line oxidation by removing ONO oxide prior to bit-line implant
摘要 A method for fabricating a semiconductor structure includes forming a masking pattern on an ONO layer, wherein the ONO layer is on a semiconductor substrate, forming pocket regions in the substrate with the masking pattern as a doping mask, etching the ONO layer with the masking pattern as an etching mask forming residual oxide regions, etching the ONO layer with a buffered oxide etch or a plasma etch exposing regions of the substrate, and removing the mask and forming a bit-line oxide layer on the exposed regions.
申请公布号 US6562683(B1) 申请公布日期 2003.05.13
申请号 US20000651704 申请日期 2000.08.31
申请人 ADVANCED MICRO DEVICES, INC. 发明人 WANG FEI;FOOTE DAVID K.;PARK STEPHEN K.
分类号 H01L21/265;H01L21/311;H01L21/314;H01L21/32;H01L21/336;H01L27/115;(IPC1-7):H01L21/336 主分类号 H01L21/265
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