发明名称 Semiconductor device of multi-wiring structure and method of manufacturing the same
摘要 A plurality of wiring layers are laminated on an LSI chip. Each wiring layer includes an electrode to which is applied a mechanical pressure, a first insulating film formed in a region where it is necessary to have a high mechanical strength and having the electrode formed therein, a second insulating film formed in the same layer as the layer of the first insulating film and formed in a region where a mechanical strength higher than that of the first insulating layer is not required, and a wiring layer formed on the surface of the second insulating film.
申请公布号 US6563218(B2) 申请公布日期 2003.05.13
申请号 US20010995602 申请日期 2001.11.29
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MATSUNAGA NORIAKI;SHIMOOKA YOSHIAKI;HIGASHI KAZUYUKI;SHIBATA HIDEKI
分类号 H01L23/52;H01L21/31;H01L21/3205;H01L21/822;H01L23/485;H01L23/522;H01L23/532;H01L27/04;(IPC1-7):H01L23/48;H01L29/40 主分类号 H01L23/52
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