发明名称 |
PROJECTION TYPE X-RAY MICROSCOPE |
摘要 |
PROBLEM TO BE SOLVED: To provide an X-ray microscope easily usable in a laboratory level and having a high resolution. SOLUTION: A projection type X-ray microscope generates X-ray by irradiating electron beam to an X-ray target, casts the generated X-ray on the specimen and photographs an X-ray transmission image of specimen. The X-ray target consists of a light element film and a metal piece fixed on the light element film. By irradiating electron beam on the metal piece constituting the X-ray target, an X-ray is generated from the region of diameter of tens nm below the metal piece.
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申请公布号 |
JP2003131000(A) |
申请公布日期 |
2003.05.08 |
申请号 |
JP20010329645 |
申请日期 |
2001.10.26 |
申请人 |
JAPAN SCIENCE & TECHNOLOGY CORP;MEIJI UNIV |
发明人 |
YOSHIMURA HIDEYASU |
分类号 |
G21K7/00;G21K5/08;H01J35/08;(IPC1-7):G21K7/00 |
主分类号 |
G21K7/00 |
代理机构 |
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