发明名称 |
Protection of an integrated circuit against ESD and other overvoltages |
摘要 |
The integrated circuit (20) includes a metal oxide semiconductor (MOS) transistors which are provided for short-circuiting the supply conductors (12,13) arranged in a supply rail (11). The MOS transistors are integrated in the supply rail, below the conductors. The control circuits (6) detect electrostatic discharge (ESD) and overvoltage between the supply conductors. <??>An Independent claim is also included for method of integrating MOS transistors for short- circuiting the supply conductors.
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申请公布号 |
EP1309005(A1) |
申请公布日期 |
2003.05.07 |
申请号 |
EP20020354167 |
申请日期 |
2002.10.21 |
申请人 |
STMICROELECTRONICS S.A. |
发明人 |
MALHERBE, ALEXANDRE;BLISSON, FABRICE |
分类号 |
H01L27/04;H01L21/822;H01L27/02;H01L27/06;(IPC1-7):H01L27/02 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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