发明名称 LOW ENERGY ION IMPLANTATION INTO SIGE
摘要 <p>A method comprising introducing a crystalline film with silicon germanium over the surface of a semiconductor substrate, and introducing a junction region by an implant of a dopant into the crystalline film. An apparatus comprising a semiconductor substrate having an active region and comprising a crystalline film comprising germanium in the active region, a gate electrode overlying the crystalline layer, and junction regions formed in the substrate adjacent opposite sides of the gate electrode.</p>
申请公布号 WO2003034480(A1) 申请公布日期 2003.04.24
申请号 US2002033454 申请日期 2002.10.17
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