发明名称 Autoadjusting charged-particle probe-forming apparatus
摘要 An autoadjusting charged-particle probe-forming apparatus improving the resolution of probe-forming charged-particle optical systems by minimizing optical aberrations. The apparatus comprises a source of charged particles, a probe-forming system of charged-particle lenses, a plurality of detectors optionally comprising a two-dimensional image detector, power supplies, a computer and appropriate software. Images are recorded by the two-dimensional detector and analyzed to determine the aberration characteristics of the apparatus. Alternately, multiple scanned images are recorded by a scanned image detector and also analyzed to determine the aberration characteristics of the apparatus. The aberration characteristics are used to automatically adjust the apparatus for improved optical performance.
申请公布号 US6552340(B1) 申请公布日期 2003.04.22
申请号 US20000686805 申请日期 2000.10.12
申请人 NION CO. 发明人 KRIVANEK ONDREJ L.;DELLBY NIKLAS;LUPINI ANDREW R.
分类号 G01Q20/04;G01Q30/04;H01J37/153;H01J37/21;H01J37/28;(IPC1-7):H01J37/21 主分类号 G01Q20/04
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