发明名称 LCD DRIVING SEMICONDUCTOR IC CIRCUIT DEVICE
摘要 PROBLEM TO BE SOLVED: To solve the problem in which waiting time is required until LCD driving terminals output signal levels, that are to be measured, in a conventional output signal level testing method of the terminals. SOLUTION: An LCD driving control circuit testing/evaluating circuit is provided with a register 11 in which writing is conducted by a program, a decoder 12 which decodes setting values of the register 11 and multiplexers 7 to 10 which conduct switching of the control signals outputted by the decoder 12 during a testing and the control signals outputted during a normal operation. During a testing, output transistors 2 to 5 are controlled by the control signals outputted by the decoder 12 and output voltage levels of the transistors 2 to 5 are outputted to an LCD from LCD driving terminals 6 so as to conduct testing and evaluation of the output voltage levels of the terminals 6.
申请公布号 JP2003114654(A) 申请公布日期 2003.04.18
申请号 JP20010307489 申请日期 2001.10.03
申请人 MITSUBISHI ELECTRIC CORP;MITSUBISHI ELECTRIC SYSTEM LSI DESIGN CORP 发明人 TANABE MUNEYUKI
分类号 G01R31/28;G01R31/316;G02F1/133;G09G3/36;(IPC1-7):G09G3/36 主分类号 G01R31/28
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