发明名称 CONDUCTION INSPECTION SHEET, CONDUCTION INSPECTION METHOD AND CONDUCTION INSPECTION DEVICE USING THE SHEET
摘要 PROBLEM TO BE SOLVED: To provide a conduction inspection sheet, a conduction inspection method and a device using the sheet capable of performing conduction inspection of a fine electrode pattern accurately and easily without using a probe. SOLUTION: This conduction inspection sheet is characterized by coating an electrophoretic microcapsule on a transparent conductive film formed on a transparent base material. This conduction inspection method is characterized by having a process for placing the conduction inspection sheet on an inspection substrate having a conductive pattern so that the electrophoretic microcapsule is brought into contact with the conductive pattern on the inspection substrate, a process for applying a voltage between the inspection substrate and the transparent conductive film, and a process for performing the conduction inspection of the conductive pattern by a contrast image observable through the transparent base material, generated on the electrophoretic microcapsule.
申请公布号 JP2003107120(A) 申请公布日期 2003.04.09
申请号 JP20010298569 申请日期 2001.09.27
申请人 TOPPAN PRINTING CO LTD 发明人 TSUKAHARA YUSUKE;SUZUKI KATSUHIRO
分类号 G01R31/02;H05K3/00;(IPC1-7):G01R31/02 主分类号 G01R31/02
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