ELECTRONIC COMPONENT AND METHOD FOR MEASURING ITS QUALIFICATION

摘要

The invention relates to an electronic component (1) with an integrated semiconductor circuit that comprises a core (2) with functional flip-flops. A part of the functional flip-flops is linked as input FFs (7) with input pins (3) of the component (1) and a part of the functional flip-flops is linked as output FFs (8) with output pins (6) of the component (1). In order to allow for efficient and cost-effective ASIC qualification methods that can be carried out rapidly and that take into consideration the growing complexity of integrated circuits and the rapid development of technology, the invention provides a method and a device wherein the input FFs (7) and the output FFs (8) are interconnected to a shift register during a qualification measurement of the component (1).