发明名称 INSPECTION METHOD AND DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an inspection method capable of accurately inspecting a display control device within a short time without incurring an increase in inspection costs. SOLUTION: The invention relates to the method for inspecting the quality of the display control device 12 for outputting display data for displaying a picture, and the method is through letting the inspection device output the display data for displaying an inspection picture to the display control device 12 subjected to the inspection, counting data values of gradation data DA0-DA5 contained in the display data in synchronization with a standard clock signal CL contained in the display data, and comparing the count values with inspection standard values DC0-DC5 about the inspection picture, and discriminating the display control device 12 as satisfactory when the values coincide.
申请公布号 JP2003091264(A) 申请公布日期 2003.03.28
申请号 JP20010282190 申请日期 2001.09.17
申请人 SEIKO EPSON CORP 发明人 INABA MASASHI;HOSOYA YOSHINORI
分类号 G01R31/00;G02F1/13;G09G3/20;G09G3/36;(IPC1-7):G09G3/36 主分类号 G01R31/00
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