发明名称 APPARATUS AND METHOD FOR MEASUREMENT OF ADHESIVE FORCE
摘要 PROBLEM TO BE SOLVED: To precisely and efficiently measure an adhesive force, even when the particle size distribution of particles to be measured is wide. SOLUTION: A computing unit 8 stores parameters required for measuring the adhesive force F, such as densityρof the particles 22 as a measuring object, densityρ0 of a medium, a propagation constant k (=2π/λ) and the like. The computing unit 8 finds the adhesive force F by using the respective parameters and a sound-pressure amplitude A [N/m<2> ] adjusted by a sound-pressure adjusting device 2. The computing unit 8 analyzes an image imaged by a microscope 6, it finds the peripheral length and the area on the projection image of each spherical particle 22, and a surface index Si which affects the acoustic radiating force of each particle is computed by using them.
申请公布号 JP2003090791(A) 申请公布日期 2003.03.28
申请号 JP20010285673 申请日期 2001.09.19
申请人 FUJI XEROX CO LTD 发明人 MUKAI HIROKAZU
分类号 G01L5/00;G01N19/04;G01N29/00;G03G21/00;(IPC1-7):G01N19/04;G01N29/20 主分类号 G01L5/00
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