发明名称 Semiconductor device
摘要 The depletion N-channel transistor has a drain region formed in a circular shape and a gate region having a circular-shaped contour, disposed therein surrounding the drain region. A source region is disposed outside the gate region, surrounding the drain region and spaced a predetermined distance away from an element-isolating oxide film. For instance, a P+ diffused layer is formed outside the source region, and the P+ diffused layer spaces the source region a predetermined distance away from the element-isolating oxide film. In the P+ diffused layer is formed a contact hole 10 that is common to the P+ diffused layer and the source region, and the gate region and the drain region are disposed concentrically with each other.
申请公布号 US2003057502(A1) 申请公布日期 2003.03.27
申请号 US20020214726 申请日期 2002.08.09
申请人 YAMAMOTO FUMITOSHI 发明人 YAMAMOTO FUMITOSHI
分类号 H01L29/78;H01L21/336;H01L21/8234;H01L27/088;H01L29/06;H01L29/417;H01L29/423;(IPC1-7):H01L29/76 主分类号 H01L29/78
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