| 摘要 |
<p>Error detection mechanisms (400) for devices (300) that have multilevel signal interfaces (330) test multilevel signals of an interface with a binary test apparatus(404). The error detection mechanisms include converting between multilevel signals of the interface and binary signals of the test apparatus. The error detection mechanisms also include repeated transmission of multilevel signals stored in a memory of a device having a multilevel signal interface for detection by the test apparatus at different binary levels.</p> |
