发明名称 |
FIELD EFFECT TRANSISTOR USING SHARP METAL-INSULATOR TRANSITION |
摘要 |
PURPOSE: A field effect transistor is provided to manifest metallic characteristic even though low density of hole is added by using sharp metal- insulator transition. CONSTITUTION: A LaTiO3(LTO) Mott transistor(410) is placed on a SrTiO3(STO) substrate(400). A Ba1-xSrxTiO3(BSTO) ferroelectric layer(420) is formed on a portion of the LTO Mott insulator. A gate electrode(430) is formed on the BSTO ferroelectric layer to apply a voltage. As a voltage is applied to the BSTO ferroelectric layer, holes are poured into the LTO Mott transistor so that abrupt metal-insulator transition occurs in it to form a conducting channel(415). A source and drain electrode(440,450) are formed on the first and second surface of the LTO Mott transistor respectively.
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申请公布号 |
KR20030024156(A) |
申请公布日期 |
2003.03.26 |
申请号 |
KR20010057176 |
申请日期 |
2001.09.17 |
申请人 |
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE |
发明人 |
KANG, GWANG YONG;KIM, HYEON TAK |
分类号 |
H01L29/786;H01L29/772;H01L29/78;H01L49/00;(IPC1-7):H01L29/772 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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