BUILT-IN SELF-TEST USING EMBEDDED MEMORY AND PROCESSOR IN AN APPLICATION SPECIFIC INTEGRATED CIRCUIT

摘要

A test method for an ASIC (100) uses an embedded processor (110) in the ASIC to execute test routines (128) from an embedded memory (128) or an external memory. During ASIC production, the test routines can comprehensively test of the blocks of the ASIC without a complicated test pattern from test equipment. The test routines can also perform power-up tests in systems or end products containing the ASIC. Test selection, activation, and result output can be implement using a few terminals (130) of the ASIC.