SCHALTUNGSANORDNUNG MIT DEAKTIVIERBAREM SCANPFAD

摘要

The inventive circuit configuration has a plurality of function blocks (FB1...FBn), each function block being connected to at least one of the other function blocks and at least a portion of these connections being provided in the form of an interlocking element (SFF1...SFFm), which can be switched from normal mode to a test mode by means of an activation line (scan enable) and which has an additional data input and data output. These additional data inputs and data outputs are interconnected by data line sections (DL1...DLl) in such a way that the interlocking elements (SFF1...SFFm) form a shift register, which in turn forms a scan path. At least one electrically programmable fuse element (SE) is arranged along the activation line (scan enable) and/or the data line sections (DL1...DLl). This fuse element either interrupts the line concerned or connects it with a defined potential.