| 摘要 |
PROBLEM TO BE SOLVED: To realize a test circuit which detects the number of clocks between signals of an operation instruction during measurement, can judge whether an operation specification is satisfied or not, and can detect easily contravention to the operation specification, and a semiconductor memory using the circuit. SOLUTION: In a semiconductor memory performing read/write of data conforming to an operation instruction successively inputted, when a first operation instruction is inputted, a reference clock is supplied to a counter, the reference clock is counted up by the counter, when a second operation instruction is inputted, a count value of the counter is compared with a number of a numerical value decided by an operation specification or less, as it is judged whether the count value reaches the numerical value decided by the operation specification or not in accordance with the compared result, when defective operation of the device is detected, it can be judged easily whether it is caused by trouble of the device or it is caused by contravention to the specification.
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