发明名称 |
CMP CONDITIONER, METHOD FOR ARRANGING HARD ABRASIVE GRAIN USED IN CMP CONDITIONER AND METHOD FOR MANUFACTURING CMP CONDITIONER |
摘要 |
PROBLEM TO BE SOLVED: To provide stable CMP conditioner characteristics and to relieve slurry or the like in polishing without forming relief groove or the like on a support member. SOLUTION: This CMP conditioner of polishing cloth for a semiconductor substrate is composed of the support member 1 and plural diamond grains 2 brazed on a surface of the supporting member 1. Plural straight lines or curved lines radially extending from a center of the support member 1 are laid out on the surface of the disk-shaped support member 1 and the diamond grains 2 are arranged on the straight lines or the curved lines. The diamond grains 2 are arranged in such a manner that density of the diamond grains 2 at edge parts is smaller than that at a center par of the support member 1. Since area where no diamond grain 2 exists is secured in radial shape on the surface of the support member 1, slurry can be relieved outward from the support member 1 in polishing. |
申请公布号 |
JP2003071718(A) |
申请公布日期 |
2003.03.12 |
申请号 |
JP20010262167 |
申请日期 |
2001.08.30 |
申请人 |
NIPPON STEEL CORP |
发明人 |
HASHINO HIDEJI;KINOSHITA TOSHIYA;SATO SETSUO;ARAKI RYUICHI |
分类号 |
B24B53/12;B24B53/017;B24D3/00;B24D7/18;H01L21/304 |
主分类号 |
B24B53/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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