发明名称 SRAM ARRAY WITH TEMPERATURE-COMPENSATED THRESHOLD VOLTAGE
摘要 Systems and methods are provided for a temperature-compensated threshold voltage VT. The stability problems associated with temperature changes are reduced for LL4TCMOS SRAM cells by providing a temperature-compensated VTN. According to one embodiment, a temperature-based modulation of a VBB potential back-biases a triple-well transistor with a temperature-compensated voltage to provide the pull-down transistor with a temperature-compensated VTN that is flat or relatively flat with respect to temperature. One embodiment provides a bias generator, including a charge pump coupled to a body terminal of the transistor(s), and a comparator coupled to the charge pump. The comparator includes a first input that receives a reference voltage, a second input that receives a VT-dependent voltage, and an output that presents a control signal to the charge pump and causes the charge pump to selectively charge the body terminal of the transistor to compensate for temperature changes.
申请公布号 US2003043640(A1) 申请公布日期 2003.03.06
申请号 US20010940968 申请日期 2001.08.28
申请人 MICRON TECHNOLOGY, INC. 发明人 MARR KENNETH W.;PORTER JOHN D.
分类号 G11C5/14;G11C11/412;G11C11/417;(IPC1-7):G11C11/00 主分类号 G11C5/14
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