发明名称 SEMICONDUCTOR DEVICE HAVING HIGH-PERMITTIVITY INSULATION FILM AND PRODUCTION METHOD THEREFOR
摘要 A semiconductor device comprising a substrate, and an insulation film formed directly or indirectly on the substrate. The insulation film contains a metal silicate film, and a silicon concentration in the metal silicate film is higher at the film−thickness−direction center than at upper and lower portions thereof.
申请公布号 WO03019643(A1) 申请公布日期 2003.03.06
申请号 WO2002JP08453 申请日期 2002.08.22
申请人 NEC CORPORATION;WATANABE, HEIJI;ONO, HARUHIKO;IKARASHI, NOBUYUKI 发明人 WATANABE, HEIJI;ONO, HARUHIKO;IKARASHI, NOBUYUKI
分类号 H01L21/28;H01L21/316;H01L29/51;(IPC1-7):H01L21/316 主分类号 H01L21/28
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