发明名称 Process for forming a large area, high gate current HEMT diode
摘要 A method of manufacturing a HEMT IC using a citric acid etchant. In order that gates of different sizes may be formed with a single etching step, a citric acid etchant is used which includes potassium citrate, citric acid and hydrogen peroxide. The wafer is first spin coated with a photoresist which is then patterned by optical lithography. The wafer is dipped in the etchant to etch the exposed semiconductor material. Metal electrodes are evaporated onto the wafer and the remaining photoresist is removed with solvent.
申请公布号 US6524899(B1) 申请公布日期 2003.02.25
申请号 US20000667360 申请日期 2000.09.21
申请人 TRW INC. 发明人 GRUNDBACHER RONALD W.;LAI RICHARD;KINTIS MARK;BARSKY MICHAEL E.;TSAI ROGER S.
分类号 H01L21/28;H01L21/306;H01L21/308;H01L21/329;H01L21/335;H01L21/338;H01L29/41;H01L29/417;H01L29/47;H01L29/778;H01L29/812;H01L29/872;(IPC1-7):H01L21/338 主分类号 H01L21/28
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