发明名称 METHOD FOR MANUFACTURING EXPOSURE MASK, METHOD FOR GENERATING MASK BASE PLATE INFORMATION, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, MASK BASE PLATE, EXPOSURE MASK AND SERVER
摘要 <p>PROBLEM TO BE SOLVED: To realize a method for manufacturing an exposure mask which is effective to solve a problem on the lowering of the yield of a product caused by the deterioration of the flatness of a mask base plate by chucking the mask base plate on the mask stage of a wafer aligner. SOLUTION: The surface shape of the principal surface of each of a plurality of mask base plates and the flatness of the principal surface thereof before and after chucking the mask base plate on the mask stage of the aligner are acquired (step S3), the mask base plate having the surface shape having good flatness both before and after it is chucked on the mask stage is prepared (step S5), and a desired pattern is formed on the mask base plate, whereby the exposure mask is formed (step S6).</p>
申请公布号 JP2003050458(A) 申请公布日期 2003.02.21
申请号 JP20020054919 申请日期 2002.02.28
申请人 TOSHIBA CORP 发明人 ITO MASAMITSU
分类号 G03F1/60;G03F7/20;H01L21/00;H01L21/027;(IPC1-7):G03F1/14 主分类号 G03F1/60
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