发明名称 |
METHOD FOR FABRICATING FLOATING TRAP FERAM |
摘要 |
PURPOSE: A method for fabricating a floating FeRAM is provided to simplify the production process and enhance reliability of storing data. CONSTITUTION: A thick silicon oxide layer is formed on a substrate(100) for high voltage. After patterning the silicon oxide layer by photolithography, a silicon oxide layer pattern(111') is left only on the high voltage region. The first photoresist pattern is removed and then an ONO layer with an upper and lower oxide and a nitride layer are patterned by photolithography. The second photoresist pattern is removed and then a thermal oxidation process is performed on the whole surface of the substrate. A thin thermal oxide layer(181) is formed on a low voltage region while the thickness of thermal oxide layer is increased on a high voltage region.
|
申请公布号 |
KR20030013763(A) |
申请公布日期 |
2003.02.15 |
申请号 |
KR20010047945 |
申请日期 |
2001.08.09 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOI, JEONG DAL;HUH, SEONG HOE;LEE, CHANG HYEON |
分类号 |
H01L21/28;H01L21/336;H01L29/792;(IPC1-7):H01L29/792 |
主分类号 |
H01L21/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|