发明名称 METHOD FOR FABRICATING FLOATING TRAP FERAM
摘要 PURPOSE: A method for fabricating a floating FeRAM is provided to simplify the production process and enhance reliability of storing data. CONSTITUTION: A thick silicon oxide layer is formed on a substrate(100) for high voltage. After patterning the silicon oxide layer by photolithography, a silicon oxide layer pattern(111') is left only on the high voltage region. The first photoresist pattern is removed and then an ONO layer with an upper and lower oxide and a nitride layer are patterned by photolithography. The second photoresist pattern is removed and then a thermal oxidation process is performed on the whole surface of the substrate. A thin thermal oxide layer(181) is formed on a low voltage region while the thickness of thermal oxide layer is increased on a high voltage region.
申请公布号 KR20030013763(A) 申请公布日期 2003.02.15
申请号 KR20010047945 申请日期 2001.08.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, JEONG DAL;HUH, SEONG HOE;LEE, CHANG HYEON
分类号 H01L21/28;H01L21/336;H01L29/792;(IPC1-7):H01L29/792 主分类号 H01L21/28
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