发明名称 SEMICONDUCTOR LIGHT-DETECTING ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor light-detecting element having high detectability by reducing dark current. SOLUTION: A underlayer 12 constituting the semiconductor light-detector 20 is made of a nitride semiconductor including Al with a dislocation density 10<11> /cm<2> or below. Furthermore, an n-type conductive layer 13 and a p-type conductive layer 15 are made of a nitride semiconductor including Al by a smaller content than the nitride semiconductor and having a dislocation density 10<10> /cm<2> or below. In addition, a light-detecting layer 14 is similarly made of a nitride semiconductor including Al at a smaller content than the nitride semiconductor and having a dislocation density 10<10> /cm<2> or below.
申请公布号 JP2003046111(A) 申请公布日期 2003.02.14
申请号 JP20010266930 申请日期 2001.09.04
申请人 NGK INSULATORS LTD 发明人 SHIBATA TOMOHIKO;SUMIYA SHIGEAKI;ASAI KEIICHIRO;TANAKA MITSUHIRO
分类号 H01L31/10;H01L21/20;H01L31/0304;H01L31/105;H01L31/18;(IPC1-7):H01L31/10 主分类号 H01L31/10
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