发明名称 |
SEMICONDUCTOR LIGHT-DETECTING ELEMENT |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor light-detecting element having high detectability by reducing dark current. SOLUTION: A underlayer 12 constituting the semiconductor light-detector 20 is made of a nitride semiconductor including Al with a dislocation density 10<11> /cm<2> or below. Furthermore, an n-type conductive layer 13 and a p-type conductive layer 15 are made of a nitride semiconductor including Al by a smaller content than the nitride semiconductor and having a dislocation density 10<10> /cm<2> or below. In addition, a light-detecting layer 14 is similarly made of a nitride semiconductor including Al at a smaller content than the nitride semiconductor and having a dislocation density 10<10> /cm<2> or below.
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申请公布号 |
JP2003046111(A) |
申请公布日期 |
2003.02.14 |
申请号 |
JP20010266930 |
申请日期 |
2001.09.04 |
申请人 |
NGK INSULATORS LTD |
发明人 |
SHIBATA TOMOHIKO;SUMIYA SHIGEAKI;ASAI KEIICHIRO;TANAKA MITSUHIRO |
分类号 |
H01L31/10;H01L21/20;H01L31/0304;H01L31/105;H01L31/18;(IPC1-7):H01L31/10 |
主分类号 |
H01L31/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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