发明名称 METALLIZED WIRING AND ITS FORMING METHOD, METALLIZED WIRING BOARD AND ITS PRODUCING METHOD
摘要 PROBLEM TO BE SOLVED: To form a metallized wiring which can deal with a large size substrate. SOLUTION: At least one layer of conductive film is formed on an insulating surface, a resist pattern is formed thereon, and then the conductive film having the resist pattern is etched to form a metallized wiring having a tapering angle αcontrolled depending on the bias power density, ICP power density, temperature of a lower electrode, pressure, total flow rate of etching gas, and the ratio of oxygen or chlorine in the etching gas. In the metallized wiring thus formed, variation is suppressed in the width and length and a large size board can be dealt with sufficiently.
申请公布号 JP2003045874(A) 申请公布日期 2003.02.14
申请号 JP20010227047 申请日期 2001.07.27
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 ONO KOJI;SUZAWA HIDEOMI
分类号 G02F1/1368;C23F4/00;G09F9/30;H01L21/20;H01L21/302;H01L21/3065;H01L21/3205;H01L21/3213;H01L21/768;H01L21/77;H01L21/8238;H01L21/84;H01L23/52;H01L27/08;H01L27/092;H01L27/12;H01L29/423;H01L29/43;H01L29/49 主分类号 G02F1/1368
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