A method and system for delivering a polishing fluid to a chemical mechanical polishing surface (104) is provided. In one embodiment, the system includes an arm (104) having a delivery portion disposed at least partially over the polishing surface. A first nozzle and a second nozzle are disposed on the delivery portion of the arm. The first nozzle (132) is adapted to flow the polishing fluid at a first rate while the second nozzle is adapted to flow the polishing fluid at a second rate that is different than the first rate. A method for delivering a polishing fluid to a chemical mechanical polishing surface generally includes the steps of supplying the polishing fluid to a semiconductor polishing surface in one location at a first rate and providing the polishing fluid to the polishing surface at a second location at a second rate which is different than the first rate.
申请公布号
WO03011523(A1)
申请公布日期
2003.02.13
申请号
WO2002US24599
申请日期
2002.08.02
申请人
APPLIED MATERIALS, INC.
发明人
WITHERS, BRADLEY, S.;MENG, BRENDA, R.;VEREEN, LIDIA;SKARPELOS, PETER, N.;DOWNUM, BRIAN, J.;WILLIAMS, PATRICK;KO, TERRY, KIN TING;LEE, CHRISTOPHER, HEUNG-GYUN;REYNOLDS, KENNETH, REESE;HEARNE, JOHN;HACHNOHI, DANIEL