| 摘要 |
PROBLEM TO BE SOLVED: To provide a circuit device capable of quickly specifying a cause site on the occurrence of abnormal operation in the circuit device as a whole for shortening a designing time of the circuit device. SOLUTION: A group of resistors 35-38 equivalent to a group of resistors 31-34 are respectively arranged in parallel to a group of resistors 31-34 arranged inside a FPGA 13, 14, 16, and 17. When a group of signals D1-D4 are computed via the group of resistors 31-34 and computing circuits 15 and 18, a computing result is obtained. A check pattern S1 is not passed through the computing circuits 15 and 18 but passed through the group of resistors 35-38 only. Signals h1 and h2 passed through only the group of resistors 35-38 are computed by an exclusive OR circuit 23, and when a difference between the total number of steps of the group of resistors 35 and 37 and that of the group of resistors 36 and 38 is detected, a difference of the number of steps of the group of resistors 31-34 is obtained.
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