发明名称 |
METHOD FOR FORMING STORAGE ELECTRODE IN SEMICONDUCTOR CAPACITOR |
摘要 |
PURPOSE: A method for forming a storage electrode in a semiconductor capacitor is provided to improve processing margins of MPS(Meta-stable Poly Silicon) growth by using step difference between a storage node oxide and silicon layer. CONSTITUTION: A storage node oxide layer(10) is formed on an insulating layer(6) having a contact plug(8). An amorphous silicon layer(12) as a storage node is deposited on the resultant structure. The amorphous silicon layer(12) is polished to expose the storage node oxide layer(10) by using a slurry composed of silica polishing agents and chemicals for etching amorphous silicon, wherein the polishing selectivity between the amorphous silicon layer(12) and the storage node oxide layer(10) is 2-5 : 1, thereby forming a step difference(t). Then, an MPS is grown on the amorphous silicon layer(12) so as to form a storage electrode.
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申请公布号 |
KR20030012114(A) |
申请公布日期 |
2003.02.12 |
申请号 |
KR20010045987 |
申请日期 |
2001.07.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, JAE OK;OH, JONG HYEOK |
分类号 |
H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
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