发明名称 |
Method and apparatus for measuring and dispensing a wafer etchant |
摘要 |
A tank is set up to hold a precise volume of acid by first adjusting an overflow pipe to establish a volume that is larger than the desired volume and then adjusting the vertical position of a volume occupying element that extends above and below the surface of the acid. The apparatus includes a drain pipe for directing the acid to a tank that holds deionized water that the acid is mixed with. The bath is used for etching a silicon dioxide layer on a semiconductor wafer.
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申请公布号 |
US2003024644(A1) |
申请公布日期 |
2003.02.06 |
申请号 |
US20020256739 |
申请日期 |
2002.09.27 |
申请人 |
CHARTERED SEMICONDUCTOR MANUFACTURING LTD. |
发明人 |
CHONG KAM BENG |
分类号 |
C23F1/00;H01L21/00;H01L21/302;H01L21/311;H01L21/461;(IPC1-7):C23F1/00 |
主分类号 |
C23F1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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