发明名称 Method and apparatus for measuring and dispensing a wafer etchant
摘要 A tank is set up to hold a precise volume of acid by first adjusting an overflow pipe to establish a volume that is larger than the desired volume and then adjusting the vertical position of a volume occupying element that extends above and below the surface of the acid. The apparatus includes a drain pipe for directing the acid to a tank that holds deionized water that the acid is mixed with. The bath is used for etching a silicon dioxide layer on a semiconductor wafer.
申请公布号 US2003024644(A1) 申请公布日期 2003.02.06
申请号 US20020256739 申请日期 2002.09.27
申请人 CHARTERED SEMICONDUCTOR MANUFACTURING LTD. 发明人 CHONG KAM BENG
分类号 C23F1/00;H01L21/00;H01L21/302;H01L21/311;H01L21/461;(IPC1-7):C23F1/00 主分类号 C23F1/00
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