发明名称 TERMINAL STRUCTURE FOR TESTING CIRCUIT OF PRINTED CIRCUIT BOARD
摘要 PURPOSE: A terminal structure for testing circuit of printed circuit board is provided to have a semicircle test terminal formed at one side of a printed circuit board. CONSTITUTION: Parts(34) are mounted on part pads(32) of a printed circuit board(30), and the part pads(32) are connected to test terminals(36) through a pattern(38). The test terminals(36) are iteratively formed at one side of the printed circuit board, and have a lead-coated semicircle shape. In the case that the printed circuit board has a multi-layer structure, the test terminals(36) are selectively formed to have a multi-layer structure.
申请公布号 KR20030010265(A) 申请公布日期 2003.02.05
申请号 KR20010045154 申请日期 2001.07.26
申请人 MANDO CORPORATION 发明人 BYUN, YEONG JUN
分类号 G01R1/04;(IPC1-7):G01R1/04 主分类号 G01R1/04
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