发明名称 Semiconductor device and its manufacturing method
摘要 The present invention provides a MISFET with a replacement gate electrode, which ensures large ON-current. A semiconductor device, in which on the substrate, first and second field effect transistors are formed, the first field effect transistor is a replacement gate type field effect transistor, and the length of the overlap between a gate electrode and a source/drain diffusion zone of the first field effect transistor correspond to that between a gate electrode and a source/drain diffusion zone of the second field effect transistor.
申请公布号 US2003022422(A1) 申请公布日期 2003.01.30
申请号 US20020081227 申请日期 2002.02.25
申请人 TORII KAZUYOSHI;TSUCHIYA RYUTA;HORIUCHI MASATADA;ONAI TAKAHIRO 发明人 TORII KAZUYOSHI;TSUCHIYA RYUTA;HORIUCHI MASATADA;ONAI TAKAHIRO
分类号 H01L21/28;H01L21/336;H01L21/8234;H01L21/8238;H01L27/092;H01L29/423;H01L29/43;H01L29/49;H01L29/78;(IPC1-7):H01L21/338 主分类号 H01L21/28
代理机构 代理人
主权项
地址