发明名称 SHAPE INSPECTION DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To automatically adjust the optimum shape inspection judge standard in a shape inspection device. SOLUTION: The shape inspection device is equipped with image pickup means (2, 9 and 10) for picking up the shape image of an object to be inspected, an image processing means 5 for inspecting the shape of the object to be inspected on the basis of a shape judging index obtained by image processing based on the shape inspection judge standard of the shape image and a shape judge standard adjusting means 4 comparing the shape judging index with an index reference value and adjusting the shape inspection judge standard on the basis of the comparing result. The shape judge standard adjusting means 4 repeats comparison and adjustment to automatically adjust the shape inspection judge standard, and the image processing means performs image processing on the basis of the shape inspection judge standard automatically adjusted by the shape judge standard adjusting means to inspect the shape of the object to be inspected.</p>
申请公布号 JP2003028633(A) 申请公布日期 2003.01.29
申请号 JP20010215761 申请日期 2001.07.16
申请人 SHIMADZU CORP 发明人 ONO TAKASHI;SAWADA RYOICHI
分类号 G01B15/04;G01B21/20;G01N23/18;(IPC1-7):G01B21/20 主分类号 G01B15/04
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