发明名称 SEMICONDUCTOR MANUFACTURING DEVICE, AND CLEANING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To effectively remove a ruthenium film, an osmium film, and oxides thereof deposited or adhered inside a semiconductor treatment device. SOLUTION: Reaction products deposited or adhered inside the device are rapidly and effectively removed by individually using an oxygen atom donating gas and a halogen gas and feeding the gases inside the device. The device can be stably operated, a thin film of high quality can be formed, and a semiconductor element can be produced in high yield.
申请公布号 JP2003027240(A) 申请公布日期 2003.01.29
申请号 JP20010220834 申请日期 2001.07.23
申请人 HITACHI LTD;HITACHI KOKUSAI ELECTRIC INC 发明人 NAKAHARA MIWAKO;ARAI TOSHIYUKI;YAMAMOTO TOMOSHI;OOKA TSUKASA;SANO ATSUSHI;ITAYA HIDEJI;SAKUMA HARUNOBU
分类号 C23C16/18;C23C16/40;C23C16/44;C23C16/455;C23F1/12;H01L21/02;H01L21/205;H01L21/28;H01L21/285;H01L21/302;H01L21/3065;H01L21/3213;(IPC1-7):C23C16/44;H01L21/306 主分类号 C23C16/18
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