发明名称 |
SEMICONDUCTOR MANUFACTURING DEVICE, AND CLEANING METHOD THEREFOR |
摘要 |
PROBLEM TO BE SOLVED: To effectively remove a ruthenium film, an osmium film, and oxides thereof deposited or adhered inside a semiconductor treatment device. SOLUTION: Reaction products deposited or adhered inside the device are rapidly and effectively removed by individually using an oxygen atom donating gas and a halogen gas and feeding the gases inside the device. The device can be stably operated, a thin film of high quality can be formed, and a semiconductor element can be produced in high yield.
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申请公布号 |
JP2003027240(A) |
申请公布日期 |
2003.01.29 |
申请号 |
JP20010220834 |
申请日期 |
2001.07.23 |
申请人 |
HITACHI LTD;HITACHI KOKUSAI ELECTRIC INC |
发明人 |
NAKAHARA MIWAKO;ARAI TOSHIYUKI;YAMAMOTO TOMOSHI;OOKA TSUKASA;SANO ATSUSHI;ITAYA HIDEJI;SAKUMA HARUNOBU |
分类号 |
C23C16/18;C23C16/40;C23C16/44;C23C16/455;C23F1/12;H01L21/02;H01L21/205;H01L21/28;H01L21/285;H01L21/302;H01L21/3065;H01L21/3213;(IPC1-7):C23C16/44;H01L21/306 |
主分类号 |
C23C16/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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