| 摘要 |
<p>PROBLEM TO BE SOLVED: To solve the problem that an internal stress produced on auxiliary capacitance upper electrodes causes a short circuit among the auxiliary capacitance electrodes and this is prone to cause a pixel defect in an active matrix type liquid crystal display device. SOLUTION: Hole parts 16b, 16c as a 1st pattern for absorbing internal stresses are formed in the auxiliary capacitance upper electrodes 16a, and notched part 13b, 13c as a 2nd pattern not overlapping the hole parts 16b, 16c and the peripheral areas are formed in auxiliary capacitance lower electrodes 13a. The internal stresses generated in the auxiliary capacitance upper electrodes are concentrated on the hole parts 16b, 16c, and even if the gate insulating film 14 of these parts is cracked and the end part of the auxiliary capacitance upper electrode 16a is deformed toward the auxiliary capacitance lower electrode 13a, the contact between the auxiliary capacitance upper electrodes 16a and the auxiliary capacitance lower electrodes 13a is prevented by the notched parts 13b, 13c.</p> |
