发明名称 METHOD AND DEVICE FOR INSPECTING WAVELENGTH OF OPTICAL SEMICONDUCTOR LASER
摘要 PROBLEM TO BE SOLVED: To shorten the time required for inspecting many semiconductor lasers. SOLUTION: The oscillation wavelength of a semiconductor laser is tuned to a prescribed target wavelength, by acquiring a corrected wavelength coefficient of replacing the fundamental wavelength coefficient of the laser from the variations in wavelength changing item for changing the wavelength of the laser and the ratio between an actually measured wavelength, which varies depending on the changes of the wavelength changing item and a target wavelength. In this case, the corrected wavelength coefficient is first found once, and thereafter, the tuning is conducted, based on the first found corrected wavelength coefficient, without finding corrected wavelength coefficients one after another.
申请公布号 JP2003017802(A) 申请公布日期 2003.01.17
申请号 JP20010198337 申请日期 2001.06.29
申请人 FUJITSU QUANTUM DEVICES LTD 发明人 ONO HARUYOSHI;BABA ISAO
分类号 G01J9/00;G01J1/42;G01M11/00;H01S5/06;H01S5/0687;(IPC1-7):H01S5/068 主分类号 G01J9/00
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