| 摘要 |
<p>A inspection method for optical modules, comprising the steps of allocating channel numbers to a plurality of optical modules, concurrently measuring a plurality of inspection items relating to the optical characteristics and electrical characteristics of a plurality of optical modules, and writing in a storing means, for each channel number, measurement data relating to a plurality of inspection items to thereby be able to inspect a plurality of optical modules efficiently and in a short time with stand-by time omitted; and an inspection device therefor.</p> |
