发明名称 |
APPARATUS AND METHOD FOR MEASURING CRT FLAT PANEL |
摘要 |
PURPOSE: An apparatus and a method for measuring a CRT flat panel are provided to increase the reliability of measurement and decrease the time required for obtaining a measured value by compensating the measured value arranged in width to a reference line on the basis of the average of point values. CONSTITUTION: A supply unit(5) supplies a flat panel(3) to a measurement unit(1). A transporting unit(7) transports a flat panel(3') measured in the measurement unit(1) to the next process. The measurement unit(1) includes a frame(13) having an upper base(9) and a lower base(11) being spaced from the upper base(9) at predetermined intervals, a lower measurement unit(15) installed on the lower base(11), and an upper measurement unit(17) installed on the upper base(9). The lower measurement unit(15) measures the flatness of a lower surface of the flat panel(3). The upper measurement unit(17) measures the flatness of an upper surface of the flat panel(3). An arranging unit is installed on the upper measurement unit(17) for arranging the flat panel(3) to be supplied to the measurement unit(1).
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申请公布号 |
KR20030003928(A) |
申请公布日期 |
2003.01.14 |
申请号 |
KR20010039794 |
申请日期 |
2001.07.04 |
申请人 |
HANKUK ELECTRIC GLASS CO., LTD. |
发明人 |
JUNG, MUN SEON;SONG, TAE GEUN |
分类号 |
H01J9/42;(IPC1-7):H01J9/42 |
主分类号 |
H01J9/42 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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