发明名称 ATOMIC LAYER CHEMICAL VAPOR DEPOSITION WITHOUT USING PURGE PROCESSING
摘要 PURPOSE: An ALCVD(Atomic Layer Chemical Vapor Deposition) method is provided to shorten one cycle processing time without using a purge processing. CONSTITUTION: In the ALCVD method, ON/OFF pulse injection time of source gas and reactive gas is controlled to 0.01-10 seconds under the pressure of 10E1-10E8 Torr. Also, the vapor pressure of source gas is controlled to 0.001-1 Torr. Preferably, the temperature of a substrate is controlled to 50-550 °C. Thereby, one cycle processing time is effectively shorten without using a purge processing.
申请公布号 KR20020096230(A) 申请公布日期 2002.12.31
申请号 KR20010034555 申请日期 2001.06.19
申请人 POSTECH FOUNDATION 发明人 KANG, SANG U;LEE, SI U
分类号 H01L21/205;(IPC1-7):H01L21/205 主分类号 H01L21/205
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