发明名称 |
COMPLEMENTARY METAL OXIDE SEMICONDUCTOR IMAGE DEVICE |
摘要 |
PURPOSE: A complementary metal oxide semiconductor(CMOS) image device is provided to normally perform a reset function even when exposure alignment for forming an ion implantation mask goes wrong, by eliminating the possibility that a low density doping region between a high density doping region and a channel region of a reset transistor functions as a barrier in exhausting optical charges when the reset transistor is open. CONSTITUTION: The CMOS image device has at least one pixel in a region where an image is detected. A semiconductor substrate layer is doped with impurities of the first conductivity type. A photodiode region is formed in the surface of the semiconductor substrate layer in a partial region of the pixel, doped with relatively low density impurities of the second conductivity type. The photodiode region includes a fixing region with a potential pinning layer(120) doped with the first conductivity type and an open region except the fixing region. A MOS-type reset transistor has a relatively high density source region doped with the second conductivity type so that a part of the source region overlaps the photodiode region in the open region.
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申请公布号 |
KR20020096336(A) |
申请公布日期 |
2002.12.31 |
申请号 |
KR20010034737 |
申请日期 |
2001.06.19 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
AHN, JEONG CHAK;KWON, GYU HYEONG;LEE, YUN JEONG |
分类号 |
H01L27/146;H01L31/0352;H01L31/062;H01L31/113;(IPC1-7):H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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