发明名称 JITTER MEASURING APPARATUS AND JITTER MEASURING METHOD
摘要 <p>A jitter measuring apparatus for measuring jitter of a discrete signal to be measured. The apparatus includes a phase error estimating device for calculating phase errors between a plurality of sample points satisfying a predetermined condition and a plurality of points where the signal to be measured has a predetermined value or a plurality of points among the discrete sample points of the signal to be measured and having a predetermined value, thereby generating a phase error sequence, and a cycle jitter estimating device for calculating a cycle jitter sequence of the signal to be measured according to the phase error sequence. For example, the phase error estimating device calculates phase errors between a plurality of approximate zero cross points satisfying a predetermined condition and a plurality of zero cross points in the signal to be measured or a plurality of zero cross points among the sample points, thereby generating a phase error sequence.</p>
申请公布号 WO2002103377(P1) 申请公布日期 2002.12.27
申请号 JP2002005968 申请日期 2002.06.14
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