发明名称 |
WAFER EDGE EXPOSURE SYSTEM |
摘要 |
PURPOSE: A system for exposing a wafer edge is provided to effectively exhaust a hot air in the system by controlling rotation rate of a convection fan. CONSTITUTION: The wafer edge exposure system comprises an exhaust line(120) for exhausting a hot air, a convection fan(130) formed at the exhaust line, and a controller(140) for controlling the rotation rate of the convection fan. The system further includes a sensor(142) for sensing the temperature of the system. The controller(140) is controlled the rotation rate of the convection fan(130) in accordance with the temperature checked by the sensor(142).
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申请公布号 |
KR20020094715(A) |
申请公布日期 |
2002.12.18 |
申请号 |
KR20010033100 |
申请日期 |
2001.06.13 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, JONG HWA |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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