发明名称 WAFER EDGE EXPOSURE SYSTEM
摘要 PURPOSE: A system for exposing a wafer edge is provided to effectively exhaust a hot air in the system by controlling rotation rate of a convection fan. CONSTITUTION: The wafer edge exposure system comprises an exhaust line(120) for exhausting a hot air, a convection fan(130) formed at the exhaust line, and a controller(140) for controlling the rotation rate of the convection fan. The system further includes a sensor(142) for sensing the temperature of the system. The controller(140) is controlled the rotation rate of the convection fan(130) in accordance with the temperature checked by the sensor(142).
申请公布号 KR20020094715(A) 申请公布日期 2002.12.18
申请号 KR20010033100 申请日期 2001.06.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JONG HWA
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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